Short Pin Test Probe 13 for IEC 61032+60335+61032

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seat: Beijing
Validity to: Long-term effective
Last update: 2017-12-09 16:48
Browse the number: 132
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The model short Test Pin Probe is used to test for accessibility of small objects and meets IEC, CSA and UL requirements. The probe is made of stainless steel with a Delrin® handle. Meets IEC 60950 and 61032, as well as other national and international standards. All ED&D probes come with NIST traceable certificates of calibration. There is an additional fee for the data, and it must be ordered in advance. ED&D utilizes ISO/IEC 17025 quality systems, and operates a full calibration lab. IEC61032-Probe 13-Figure 9

Meets Requirements for Testing Standard(s) including but not limited to:IEC 60601 IEC 61010 IEC 60950 IEC 61032

Test probe diameter 3mm
Test probe length 15mm
Baffle plate thickness 4mm
Baffle plate diameter 25mm
Handle length 20mm
Handle diameter 10mm
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